Quantitative mapping of high modulus materials at the nanoscale : comparative study between atomic force microscopy and nanoindentation

enthalten in: Journal of microscopy | 2020

von Coq Germanicus, R. | Mercier, D. | Agrebi, F. | +4

Microstructure and electrical characterization based on AFM of very high-doped polysilicon grains

enthalten in: Applied surface science | 2007

von Coq Germanicus, R. | Picard, E. | Domenges, B. | +2