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/vufind/Search/Results?lookfor=%22Atom-probe+tomography%22&type=Subject&sort=year%2C+publishDateDaySort_date+desc%2C+id
/vufind/Search/Results?lookfor=%22Atom-probe+tomography%22&type=Subject&sort=year%2C+publishDateDaySort_date+desc%2C+id
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PubPharm (536)
1
Silica-embedded Gold Nanoparticles Analyzed by Atom Probe Tomography
enthalten in:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
| 2024
von
Eriksson, G.
|
Hulander, M.
|
Thuvander, M.
| +1
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2
Interfacial Segregation of Sn during the Continuous Annealing and Selective Oxidation of Fe-Mn-Sn Alloys
enthalten in:
Materials (Basel, Switzerland)
| 2024
von
Wagner, J.
|
McDermid, J.
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3
On the Use of a Cluster Identification Method and a Statistical Approach for Analyzing Atom Probe Tomography Data for GP Zones in Al-Zn-Mg(-Cu) Alloys
enthalten in:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
| 2024
von
Shah, S.
|
Thronsen, E.
|
De Geuser, F.
| +4
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4
Significant Oxygen Underestimation When Quantifying Barium-Doped SrTiO Layers by Atom Probe Tomography
enthalten in:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
| 2024
von
Morris, R.
|
Lin, J.
|
Scheerder, J.
| +6
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5
Influence of the Emitter Shape on the Field-of-View in Atom Probe Tomography
enthalten in:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
| 2024
von
Dialameh, M.
|
Ling, Y.
|
Bogdanowicz, J.
| +4
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6
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
enthalten in:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
| 2024
von
Uzuhashi, J.
|
Ohkubo, T.
|
Hono, K.
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7
Nuclear Spin-Depleted, Isotopically Enriched 70 Ge/28 Si70 Ge Quantum Wells
enthalten in:
Advanced materials (Deerfield Beach, Fla.)
| 2024
von
Moutanabbir, O.
|
Assali, S.
|
Attiaoui, A.
| +6
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8
In Situ Metallic Coating of Atom Probe Specimen for Enhanced Yield, Performance, and Increased Field-of-View
enthalten in:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
| 2024
von
Schwarz, T.
|
Woods, E.
|
Singh, M.
| +8
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9
Field-dependent abundances of hydride molecular ions in atom probe tomography of III-N semiconductors
enthalten in:
Journal of microscopy
| 2024
von
Diagne, A.
|
Garcia, L.
|
Ndiaye, S.
| +4
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10
Preparation of atom probe tips from (nano)particles in dispersion using (di)electrophoresis and electroplating
enthalten in:
Microscopy research and technique
| 2024
von
Vorlaufer, N.
|
Josten, J.
|
Carl, S.
| +5
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Thema
372
Journal Article
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atom probe tomography
178
Atom probe tomography
137
Research Support, Non-U.S. Gov't
46
Research Support, U.S. Gov't, Non-P.H.S.
26
Atom Probe Tomography
21
transmission electron microscopy
19
Transmission electron microscopy
17
Atom probe tomography (APT)
15
Segregation
13
Chemistry/ Metallurgy/ Environment/ Mine Industry
13
Oxidation
13
atom-probe tomography
13
工业技术
13
理工B(化学化工冶金环境矿业)
12
Metal Science and Metal Technics
12
金属学与金属工艺
11
field evaporation
11
nanoparticles
11
金属学与热处理
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Erscheinungszeitraum
171
2020-
361
2010-2019
4
2000-2009
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518
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13
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