Dark-based Optical Sectioning assists Background Removal in Fluorescence Microscopy
Abstract A fundamental challenge in fluorescence microscopy is the defocused background caused by scattering light, optical aberration, or limited axial resolution. Severe defocus backgrounds will submerge the in-focus information and cause artifacts in the following processing. Here, we leverage a priori knowledge about dark channels of biological structures and dual frequency separation to develop a single-frame defocus removal algorithm. It stably improves the signal-to-background ratio and structural similarity index measure of images by approximately 10-fold, and recovers in-focus signal with 85% accuracy, even when the defocus background is 50 times larger than in-focus information. Our Dark-based optical sectioning approach (Dark sectioning) is fully compatible with various microscopy techniques, such as wide-filed microscopy, polarized microscopy, laser-scanning / spinning-disk confocal microscopy, stimulated emission depletion microscopy, lightsheet microscopy, and light-field microscopy. It also complements reconstruction or processing algorithms such as deconvolution, structure illumination microscopy, and super-resolution optical fluctuation imaging..
Medienart: |
Preprint |
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Erscheinungsjahr: |
2024 |
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Erschienen: |
2024 |
Enthalten in: |
bioRxiv.org - (2024) vom: 06. März Zur Gesamtaufnahme - year:2024 |
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Sprache: |
Englisch |
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Beteiligte Personen: |
Cao, Ruijie [VerfasserIn] |
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Links: |
Volltext [kostenfrei] |
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Themen: |
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doi: |
10.1101/2024.03.02.578598 |
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funding: |
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Förderinstitution / Projekttitel: |
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PPN (Katalog-ID): |
XBI042693594 |
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520 | |a Abstract A fundamental challenge in fluorescence microscopy is the defocused background caused by scattering light, optical aberration, or limited axial resolution. Severe defocus backgrounds will submerge the in-focus information and cause artifacts in the following processing. Here, we leverage a priori knowledge about dark channels of biological structures and dual frequency separation to develop a single-frame defocus removal algorithm. It stably improves the signal-to-background ratio and structural similarity index measure of images by approximately 10-fold, and recovers in-focus signal with 85% accuracy, even when the defocus background is 50 times larger than in-focus information. Our Dark-based optical sectioning approach (Dark sectioning) is fully compatible with various microscopy techniques, such as wide-filed microscopy, polarized microscopy, laser-scanning / spinning-disk confocal microscopy, stimulated emission depletion microscopy, lightsheet microscopy, and light-field microscopy. It also complements reconstruction or processing algorithms such as deconvolution, structure illumination microscopy, and super-resolution optical fluctuation imaging. | ||
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700 | 1 | |a Li, Yaning |4 aut | |
700 | 1 | |a Wang, Wenyi |4 aut | |
700 | 1 | |a Zhang, Guoxun |4 aut | |
700 | 1 | |a Wang, Gang |0 (orcid)0009-0002-9979-093X |4 aut | |
700 | 1 | |a Sun, Yu |0 (orcid)0009-0009-0484-5637 |4 aut | |
700 | 1 | |a Ren, Wei |0 (orcid)0000-0002-5014-8113 |4 aut | |
700 | 1 | |a Sun, Jing |4 aut | |
700 | 1 | |a Hou, Yiwei |0 (orcid)0000-0002-5764-2384 |4 aut | |
700 | 1 | |a Xu, Xinzhu |0 (orcid)0000-0003-2302-2053 |4 aut | |
700 | 1 | |a Hu, Jiakui |4 aut | |
700 | 1 | |a Lu, Yanye |0 (orcid)0000-0002-3063-8051 |4 aut | |
700 | 1 | |a Li, Changhui |0 (orcid)0000-0002-6179-2684 |4 aut | |
700 | 1 | |a Wu, Jiamin |0 (orcid)0000-0003-3479-1026 |4 aut | |
700 | 1 | |a Li, Meiqi |0 (orcid)0000-0003-3586-176X |4 aut | |
700 | 1 | |a Qu, Junle |0 (orcid)0000-0001-7833-4711 |4 aut | |
700 | 1 | |a Xi, Peng |4 aut | |
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