Physical insight of random fluctuation in metal/IGZO Schottky barriers for low-variation contact optimal design

The study aimed to investigate the impact of random fluctuations in Schottky barrier formation at polar interfaces between InGaZnO4 (IGZO) and different metals, particularly in the context of device miniaturization. The investigation revealed that different metals can establish various crystalline IGZO interfaces to achieve Ohmic contact, regardless of their work function. Additionally, the study suggests that introducing In doping at the amorphous IGZO interface can effectively reduce the Schottky barrier when in contact with Al metal. These findings provide theoretical guidance for the miniaturization of source-drain contacts in IGZO devices.

Medienart:

E-Artikel

Erscheinungsjahr:

2024

Erschienen:

2024

Enthalten in:

Zur Gesamtaufnahme - volume:26

Enthalten in:

Physical chemistry chemical physics : PCCP - 26(2024), 15 vom: 17. Apr., Seite 11582-11588

Sprache:

Englisch

Beteiligte Personen:

Xu, Lijun [VerfasserIn]
Luo, Kun [VerfasserIn]
Zhan, Guohui [VerfasserIn]
Liu, Jiangtao [VerfasserIn]
Wu, Zhenhua [VerfasserIn]

Links:

Volltext

Themen:

Journal Article

Anmerkungen:

Date Revised 17.04.2024

published: Electronic

Citation Status PubMed-not-MEDLINE

doi:

10.1039/d3cp06131k

funding:

Förderinstitution / Projekttitel:

PPN (Katalog-ID):

NLM370233883