Direct Visualization of Chemical Transport in Solid-State Chemical Reactions by Time-of-Flight Secondary Ion Mass Spectrometry

Systematic control and design of solid-state chemical reactions are required for modifying materials properties and in novel synthesis. Understanding chemical dynamics at the nanoscale is therefore essential to revealing the key reactive pathways. Herein, we combine focused ion beam-scanning electron microscopy (FIB-SEM) and time-of-flight secondary ion mass spectrometry (TOF-SIMS) to track the migration of sodium from a borate coating to the oxide scale during in situ hot corrosion testing. We map the changing distribution of chemical elements and compounds from 50 to 850 °C to reveal how sodium diffusion induces corrosion. The results are validated by in situ X-ray diffraction and post-mortem TOF-SIMS. We additionally retrieve the through-solid sodium diffusion rate by fitting measurements to a Fickian diffusion model. This study presents a step change in analyzing microscopic diffusion mechanics with high chemical sensitivity and selectivity, a widespread analytical challenge that underpins the defining rates and mechanisms of solid-state reactions.

Medienart:

E-Artikel

Erscheinungsjahr:

2024

Erschienen:

2024

Enthalten in:

Zur Gesamtaufnahme - volume:24

Enthalten in:

Nano letters - 24(2024), 12 vom: 27. März, Seite 3702-3709

Sprache:

Englisch

Beteiligte Personen:

Pham, Sang T [VerfasserIn]
Tieu, Anh Kiet [VerfasserIn]
Sun, Chao [VerfasserIn]
Wan, Shanhong [VerfasserIn]
Collins, Sean M [VerfasserIn]

Links:

Volltext

Themen:

Ceramic coatings
Hot corrosion
In situ heating
Journal Article
Sodium diffusion
TOF-SIMS

Anmerkungen:

Date Revised 31.03.2024

published: Print-Electronic

Citation Status PubMed-not-MEDLINE

doi:

10.1021/acs.nanolett.4c00021

funding:

Förderinstitution / Projekttitel:

PPN (Katalog-ID):

NLM369672356