Probing interlayer van der Waals strengths of two-dimensional surfaces and defects, through STM tip-induced elastic deformations

© 2023 IOP Publishing Ltd..

A methodology to test the interlayer bonding strength of two-dimensional (2D) surfaces and associated one (1D)- and two (2D)- dimensional surface defects using scanning tunneling microscope tip-induced deformation, is demonstrated. Surface elastic deformation characteristics of soft 2D monatomic sheets of graphene and graphite in contrast to NbSe2indicates related association with the underlying local bonding configurations. Surface deformation of 2D graphitic moiré patterns reveal the inter-layer van der Waals strength varying across its domains. These results help in the understanding of the comparable interlayer bonding strength of 1D grain boundary as well as the grains. Anomalous phenomena related to probing 2D materials at small gap distances as a function of strain is discussed.

Medienart:

E-Artikel

Erscheinungsjahr:

2023

Erschienen:

2023

Enthalten in:

Zur Gesamtaufnahme - volume:34

Enthalten in:

Nanotechnology - 34(2023), 15 vom: 02. Feb.

Sprache:

Englisch

Beteiligte Personen:

Sarkar, N [VerfasserIn]
Bandaru, P R [VerfasserIn]
Dynes, R C [VerfasserIn]

Links:

Volltext

Themen:

Atomic deformation
Journal Article
Moiré pattern
Scanning tunneling microscopy
Van der Waals

Anmerkungen:

Date Completed 03.02.2023

Date Revised 03.02.2023

published: Electronic

Citation Status PubMed-not-MEDLINE

doi:

10.1088/1361-6528/acb442

funding:

Förderinstitution / Projekttitel:

PPN (Katalog-ID):

NLM351634908