Decoupling Through-Tip Illumination from Scanning in Nanoscale Photo-SECM

The use of scanning electrochemical microscopy (SECM) for nanoscale imaging of photoelectrochemical processes at semiconductor surfaces has recently been demonstrated. To illuminate a microscopic portion of the substrate surface facing the SECM probe, a glass-sealed, polished tip simultaneously served as a nanoelectrode and a light guide. One issue affecting nanoscale photo-SECM experiments is mechanical interactions of the rigid optical fiber with the tip motion controlled by the piezo-positioner. Here we report an improved experimental setup in which the tip is mechanically decoupled from the fiber and light is delivered to the back of the tip capillary using a complex lens system. The advantages of this approach are evident from the improved quality of the approach curves and photo-SECM images. The light intensity delivered from the optical fiber to the tip is not changed significantly by their decoupling.

Medienart:

E-Artikel

Erscheinungsjahr:

2022

Erschienen:

2022

Enthalten in:

Zur Gesamtaufnahme - volume:94

Enthalten in:

Analytical chemistry - 94(2022), 20 vom: 24. Mai, Seite 7169-7173

Sprache:

Englisch

Beteiligte Personen:

Askarova, Gaukhar [VerfasserIn]
Hesari, Mahdi [VerfasserIn]
Wang, Chen [VerfasserIn]
Mirkin, Michael V [VerfasserIn]

Links:

Volltext

Themen:

Journal Article
Research Support, U.S. Gov't, Non-P.H.S.

Anmerkungen:

Date Completed 25.05.2022

Date Revised 01.06.2022

published: Print-Electronic

Citation Status MEDLINE

doi:

10.1021/acs.analchem.2c00753

funding:

Förderinstitution / Projekttitel:

PPN (Katalog-ID):

NLM340611170