Atomic scale displacements detected by optical image cross-correlation analysis and 3D printed marker arrays
For analyzing displacement-vector fields in mechanics, for example to characterize the properties of 3D printed mechanical metamaterials, routine high-precision position measurements are indispensable. For this purpose, nanometer-scale localization errors have been achieved by wide-field optical-image cross-correlation analysis. Here, we bring this approach to atomic-scale accuracy by combining it with well-defined 3D printed marker arrays. By using an air-lens with a numerical aperture of [Formula: see text] and a free working distance of [Formula: see text], and an [Formula: see text] array of markers with a diameter of [Formula: see text] and a period of [Formula: see text], we obtain 2D localization errors as small as [Formula: see text] in [Formula: see text] measurement time ([Formula: see text]). The underlying experimental setup is simple, reliable, and inexpensive, and the marker arrays can easily be integrated onto and into complex architectures during their 3D printing process.
Medienart: |
E-Artikel |
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Erscheinungsjahr: |
2021 |
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Erschienen: |
2021 |
Enthalten in: |
Zur Gesamtaufnahme - volume:11 |
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Enthalten in: |
Scientific reports - 11(2021), 1 vom: 27. Jan., Seite 2304 |
Sprache: |
Englisch |
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Beteiligte Personen: |
Frenzel, Tobias [VerfasserIn] |
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Anmerkungen: |
Date Revised 31.01.2021 published: Electronic Citation Status PubMed-not-MEDLINE |
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doi: |
10.1038/s41598-021-81712-8 |
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funding: |
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Förderinstitution / Projekttitel: |
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PPN (Katalog-ID): |
NLM320666484 |
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