1 μs broadband frequency sweeping reflectometry for plasma density and fluctuation profile measurements

Frequency swept reflectometry has reached the symbolic value of 1 μs sweeping time; this performance has been made possible, thanks to an improved control of the ramp voltage driving the frequency source. In parallel, the memory depth of the acquisition system has been upgraded and can provide up to 200 000 signals during a plasma discharge. Additional improvements regarding the trigger delay determination of the acquisition and the voltage ramp linearity required by this ultra-fast technique have been set. While this diagnostic is traditionally dedicated to the plasma electron density profile measurement, such a fast sweeping rate can provide the study of fast plasma events and turbulence with unprecedented time and radial resolution from the edge to the core. Experimental results obtained on ASDEX Upgrade plasmas are presented to demonstrate the performances of the diagnostic.

Medienart:

E-Artikel

Erscheinungsjahr:

2017

Erschienen:

2017

Enthalten in:

Zur Gesamtaufnahme - volume:88

Enthalten in:

The Review of scientific instruments - 88(2017), 11 vom: 28. Nov., Seite 113506

Sprache:

Englisch

Beteiligte Personen:

Clairet, F [VerfasserIn]
Bottereau, C [VerfasserIn]
Medvedeva, A [VerfasserIn]
Molina, D [VerfasserIn]
Conway, G D [VerfasserIn]
Silva, A [VerfasserIn]
Stroth, U [VerfasserIn]
ASDEX Upgrade Team [VerfasserIn]
Tore Supra Team [VerfasserIn]
EUROfusion MST1 Team [VerfasserIn]

Links:

Volltext

Themen:

Journal Article

Anmerkungen:

Date Completed 05.02.2018

Date Revised 05.02.2018

published: Print

Citation Status PubMed-not-MEDLINE

doi:

10.1063/1.4991789

funding:

Förderinstitution / Projekttitel:

PPN (Katalog-ID):

NLM278608566