Performance enhancement of a GaAs detector with a vertical field and an embedded thin low-temperature grown layer

Low temperature growth of GaAs (LT-GaAs) near 200 °C results in a recombination lifetime of nearly 1 ps, compared with approximately 1 ns for regular temperature ~600 °C grown GaAs (RT-GaAs), making it suitable for ultra high speed detection applications. However, LT-GaAs detectors usually suffer from low responsivity due to low carrier mobility. Here we report electro-optic sampling time response measurements of a detector that employs an AlGaAs heterojunction, a thin layer of LT-GaAs, a channel of RT-GaAs, and a vertical electric field that together facilitate collection of optically generated electrons while suppressing collection of lower mobility holes. Consequently, these devices have detection efficiency near that of RT-GaAs yet provide pulse widths nearly an order of magnitude faster--~6 ps for a cathode-anode separation of 1.3 μm and ~12 ps for distances more than 3 μm.

Medienart:

E-Artikel

Erscheinungsjahr:

2013

Erschienen:

2013

Enthalten in:

Zur Gesamtaufnahme - volume:13

Enthalten in:

Sensors (Basel, Switzerland) - 13(2013), 2 vom: 18. Feb., Seite 2475-83

Sprache:

Englisch

Beteiligte Personen:

Currie, Marc [VerfasserIn]
Dianat, Pouya [VerfasserIn]
Persano, Anna [VerfasserIn]
Martucci, Maria Concetta [VerfasserIn]
Quaranta, Fabio [VerfasserIn]
Cola, Adriano [VerfasserIn]
Nabet, Bahram [VerfasserIn]

Links:

Volltext

Themen:

Journal Article
Research Support, U.S. Gov't, Non-P.H.S.

Anmerkungen:

Date Completed 18.12.2013

Date Revised 21.10.2021

published: Electronic

Citation Status PubMed-not-MEDLINE

doi:

10.3390/s130202475

funding:

Förderinstitution / Projekttitel:

PPN (Katalog-ID):

NLM225216264