Method for measuring temperature change of organelle

The invention relates to a method for measuring the temperature change of an organelle. The method comprises the steps of preparing a temperature-sensitive water-soluble CdTe/CdS/ZnS quantum dot solution, and coating silicon dioxide on the temperature-sensitive water-soluble CdTe/CdS/ZnS quantum dot solution by using a reverse microemulsion method to obtain a CdTe/CdS/ZnS@SiO2 particle solution; then preparing a positioning probe CdTe/CdS/ZnS@SiO2-Cyto, a lysosome targeting positioning probe CdTe/CdS/ZnS@ SiO2-Lyso or a mitochondria targeting positioning probe CdTe/CdS/ZnS@SiO2-Mito for ingesting cytoplasm in cells; respectively taking positioning probes into cells through a liposome transfection method, carrying out targeted positioning in intracellular cytoplasm or on different organelles through different targeted modifications, combining with the temperature-sensitive characteristics of CdTe/CdS/ZnS quantum dots, and realizing acquisition of temperature-sensitive fluorescence information of quantum dots of a targeted organelle through the action of combining an inverted fluorescence microscope with slit locking of a spectrograph, so that temperature change information in cytoplasm or temperature change information of the targeted localized organelle is obtained. According to the invention, targeting cytoplasm and specific organelles (such as lysosome and mitochondria) and monitoring the temperature change of the cytoplasm and specific organelles are realized..

Medienart:

Patent

Erscheinungsjahr:

2021

Erschienen:

2021

Enthalten in:

Europäisches Patentamt - (2021) vom: 20. Apr. Zur Gesamtaufnahme - year:2021

Sprache:

Englisch

Beteiligte Personen:

JIANG XINBING [VerfasserIn]
ZHANG ZHANQIN [VerfasserIn]
DING SHUJIANG [VerfasserIn]
LI BENQIANG [VerfasserIn]

Links:

Volltext [kostenfrei]

Themen:

615
B82Y: Specific uses or applications of nanostructures; measurement or analysis of nanostructures; manufacture or treatment of nanostructures
C09K: Materials for applications not otherwise provided for; applications of materials not otherwise provided for
Cet
G01K: Measuring temperature; measuring quantity of heat; thermally-sensitive elements not otherwise provided for (radiation pyrometry g01j0005000000)
Phy

Anmerkungen:

Source: www.epo.org (no modifications made), First posted: 2021-04-20, Last update posted on www.tib.eu: 2022-04-11, Last updated: 2023-02-09

Patentnummer:

CN112683417

Förderinstitution / Projekttitel:

PPN (Katalog-ID):

EPA012141194