Measurement and testing system that includes a data processing device configured to synchronize a first plurality of data values with a second plurality of data values by determining which first timestamps correspond to which second timestamps and to interpolate values missing from the second values
A measurement and testing system is disclosed herein. The measurement and testing system includes a first measurement device and a second measurement device and a data processing device operatively coupled to the first measurement device and the second measurement device. In one or more embodiments, the data processing device is configured to synchronize each of a first plurality of data values from the first measurement device with each of a second plurality of data values from the second measurement device by determining which first timestamps associated with the first plurality of data values correspond to second timestamps associated with the second plurality of data values. In one or more other embodiments, the data processing device is configured to compute time-delayed values of one or more first measurement signals from a first measurement device using a predetermined time delay..
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Patent| Erscheinungsjahr: |
2020 |
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| Erschienen: |
2020 |
| Enthalten in: |
Europäisches Patentamt - (2020) vom: 13. Okt. Zur Gesamtaufnahme - year:2020 |
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| Sprache: |
Englisch |
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| Beteiligte Personen: |
WILSON TODD CHRISTOPHER [VerfasserIn] |
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| Links: |
Volltext [kostenfrei] |
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| Themen: |
615 |
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| Anmerkungen: |
Source: www.epo.org (no modifications made), First posted: 2020-10-13, Last update posted on www.tib.eu: 2022-06-13, Last updated: 2023-02-09 |
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| Patentnummer: |
US10803990 |
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| Förderinstitution / Projekttitel: |
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| PPN (Katalog-ID): |
EPA006062032 |
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| 245 | 1 | 0 | |a Measurement and testing system that includes a data processing device configured to synchronize a first plurality of data values with a second plurality of data values by determining which first timestamps correspond to which second timestamps and to interpolate values missing from the second values |
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| 500 | |a Source: www.epo.org (no modifications made), First posted: 2020-10-13, Last update posted on www.tib.eu: 2022-06-13, Last updated: 2023-02-09 | ||
| 520 | |a A measurement and testing system is disclosed herein. The measurement and testing system includes a first measurement device and a second measurement device and a data processing device operatively coupled to the first measurement device and the second measurement device. In one or more embodiments, the data processing device is configured to synchronize each of a first plurality of data values from the first measurement device with each of a second plurality of data values from the second measurement device by determining which first timestamps associated with the first plurality of data values correspond to second timestamps associated with the second plurality of data values. In one or more other embodiments, the data processing device is configured to compute time-delayed values of one or more first measurement signals from a first measurement device using a predetermined time delay. | ||
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