Electrical Conduction Characteristic of a 2D MXene Device with Cu/Cr2C/TiN Structure Based on Density Functional Theory

The electronic structure and the corresponding electrical conductive behavior of the Cu/Cr2C/TiN stack were assessed according to a newly developed first-principle model based on density functional theory. Using an additional Cr2C layer provides the metal-like characteristic of the Cu/Cr2C/TiN stack with much larger electrical conduction coefficients (i.e., mobility, diffusivity, and electrical conductivity) than the conventional Ag/Ti3C2/Pt stack due to the lower activation energy. This device is therefore capable of offering faster switching speeds, lower programming voltage, and better stability and durability than the memristor device with conventional Ti3C2 MXene.

Medienart:

E-Artikel

Erscheinungsjahr:

2020

Erschienen:

2020

Enthalten in:

Zur Gesamtaufnahme - volume:13

Enthalten in:

Materials (Basel, Switzerland) - 13(2020), 17 vom: 20. Aug.

Sprache:

Englisch

Beteiligte Personen:

Wang, Lei [VerfasserIn]
Wen, Jing [VerfasserIn]
Jiang, Yuan [VerfasserIn]
Ou, Qiaofeng [VerfasserIn]
Yu, Lei [VerfasserIn]
Xiong, Bang-Shu [VerfasserIn]
Yang, Bingxing [VerfasserIn]
Zhang, Chao [VerfasserIn]
Tong, Yi [VerfasserIn]

Links:

Volltext

Themen:

Cr2C
First-principle study
Journal Article
MXene
Memristor

Anmerkungen:

Date Revised 01.10.2020

published: Electronic

Citation Status PubMed-not-MEDLINE

doi:

10.3390/ma13173671

funding:

Förderinstitution / Projekttitel:

PPN (Katalog-ID):

NLM313989516