Spectroscopic Properties of Si-nc in SiOx Films Using HFCVD
In the present work, non-stoichiometric silicon oxide films (SiOx) deposited using a hot filament chemical vapor deposition technique at short time and simple parameters of depositions are reported. This is motivated by the numerous potential applications of SiOx films in areas such as optoelectronics. SiOx films were characterized with different spectroscopic techniques. The deposited films have interesting characteristics such as the presence of silicon nanoclusters without applying thermal annealing, in addition to a strong photoluminescence after applying thermal annealing in the vicinity of 1.5 eV, which may be attributed to the presence of small, oxidized silicon grains (less than 2 nm) or silicon nanocrystals (Si-nc). An interesting correlation was found between oxygen content, the presence of hydrogen, and the formation of defects in the material, with parameters such as the band gap and the Urbach energies. This correlation is interesting in the development of band gap engineering for this material for applications in photonic devices.
| Medienart: |
E-Artikel |
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| Erscheinungsjahr: |
2020 |
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| Erschienen: |
2020 |
| Enthalten in: |
Zur Gesamtaufnahme - volume:10 |
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| Enthalten in: |
Nanomaterials (Basel, Switzerland) - 10(2020), 7 vom: 20. Juli |
| Sprache: |
Englisch |
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| Beteiligte Personen: |
Hernández Simón, Zaira Jocelyn [VerfasserIn] |
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| Links: |
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| Themen: |
Band gap engineering |
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| Anmerkungen: |
Date Revised 28.09.2020 published: Electronic Citation Status PubMed-not-MEDLINE |
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| doi: |
10.3390/nano10071415 |
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| funding: |
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| Förderinstitution / Projekttitel: |
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| PPN (Katalog-ID): |
NLM312745354 |
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| 100 | 1 | |a Hernández Simón, Zaira Jocelyn |e verfasserin |4 aut | |
| 245 | 1 | 0 | |a Spectroscopic Properties of Si-nc in SiOx Films Using HFCVD |
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| 500 | |a Date Revised 28.09.2020 | ||
| 500 | |a published: Electronic | ||
| 500 | |a Citation Status PubMed-not-MEDLINE | ||
| 520 | |a In the present work, non-stoichiometric silicon oxide films (SiOx) deposited using a hot filament chemical vapor deposition technique at short time and simple parameters of depositions are reported. This is motivated by the numerous potential applications of SiOx films in areas such as optoelectronics. SiOx films were characterized with different spectroscopic techniques. The deposited films have interesting characteristics such as the presence of silicon nanoclusters without applying thermal annealing, in addition to a strong photoluminescence after applying thermal annealing in the vicinity of 1.5 eV, which may be attributed to the presence of small, oxidized silicon grains (less than 2 nm) or silicon nanocrystals (Si-nc). An interesting correlation was found between oxygen content, the presence of hydrogen, and the formation of defects in the material, with parameters such as the band gap and the Urbach energies. This correlation is interesting in the development of band gap engineering for this material for applications in photonic devices | ||
| 650 | 4 | |a Journal Article | |
| 650 | 4 | |a Si-ncs | |
| 650 | 4 | |a SiOx films | |
| 650 | 4 | |a band gap engineering | |
| 650 | 4 | |a ellipsometric spectroscopy | |
| 650 | 4 | |a photoluminescence | |
| 650 | 4 | |a spectroscopic characterizations | |
| 700 | 1 | |a Luna López, Jose Alberto |e verfasserin |4 aut | |
| 700 | 1 | |a de la Luz, Alvaro David Hernández |e verfasserin |4 aut | |
| 700 | 1 | |a Pérez García, Sergio Alfonso |e verfasserin |4 aut | |
| 700 | 1 | |a Benítez Lara, Alfredo |e verfasserin |4 aut | |
| 700 | 1 | |a García Salgado, Godofredo |e verfasserin |4 aut | |
| 700 | 1 | |a Carrillo López, Jesus |e verfasserin |4 aut | |
| 700 | 1 | |a Mendoza Conde, Gabriel Omar |e verfasserin |4 aut | |
| 700 | 1 | |a Martínez Hernández, Hayde Patricia |e verfasserin |4 aut | |
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| 856 | 4 | 0 | |u http://dx.doi.org/10.3390/nano10071415 |3 Volltext |
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