Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards : Contact Material and Geometry

In this paper, we show that quantum Hall resistance measurements using two terminals may be as precise as four-terminal measurements when applying superconducting split contacts. The described sample designs eliminate resistance contributions of terminals and contacts such that the size and complexity of next-generation quantized Hall resistance devices can be significantly improved.

Medienart:

E-Artikel

Erscheinungsjahr:

2019

Erschienen:

2019

Enthalten in:

Zur Gesamtaufnahme - volume:66

Enthalten in:

IEEE transactions on electron devices - 66(2019), 9 vom: 13.

Sprache:

Englisch

Beteiligte Personen:

Kruskopf, Mattias [VerfasserIn]
Rigosi, Albert F [VerfasserIn]
Panna, Alireza R [VerfasserIn]
Patel, Dinesh K [VerfasserIn]
Jin, Hanbyul [VerfasserIn]
Marzano, Martina [VerfasserIn]
Berilla, Michael [VerfasserIn]
Newell, David B [VerfasserIn]
Elmquist, Randolph E [VerfasserIn]

Links:

Volltext

Themen:

Epitaxial graphene (EG)
Journal Article
Multi-series (MS) contacts
Quantized Hall resistance (QHR) standards
Quantum Hall effect (QHE)
Superconducting contacts

Anmerkungen:

Date Revised 10.01.2021

published: Print

Citation Status PubMed-not-MEDLINE

doi:

10.1109/ted.2019.2926684

funding:

Förderinstitution / Projekttitel:

PPN (Katalog-ID):

NLM307084760