Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards : Contact Material and Geometry
In this paper, we show that quantum Hall resistance measurements using two terminals may be as precise as four-terminal measurements when applying superconducting split contacts. The described sample designs eliminate resistance contributions of terminals and contacts such that the size and complexity of next-generation quantized Hall resistance devices can be significantly improved.
Medienart: |
E-Artikel |
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Erscheinungsjahr: |
2019 |
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Erschienen: |
2019 |
Enthalten in: |
Zur Gesamtaufnahme - volume:66 |
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Enthalten in: |
IEEE transactions on electron devices - 66(2019), 9 vom: 13. |
Sprache: |
Englisch |
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Beteiligte Personen: |
Kruskopf, Mattias [VerfasserIn] |
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Links: |
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Themen: |
Epitaxial graphene (EG) |
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Anmerkungen: |
Date Revised 10.01.2021 published: Print Citation Status PubMed-not-MEDLINE |
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doi: |
10.1109/ted.2019.2926684 |
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funding: |
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Förderinstitution / Projekttitel: |
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PPN (Katalog-ID): |
NLM307084760 |
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700 | 1 | |a Rigosi, Albert F |e verfasserin |4 aut | |
700 | 1 | |a Panna, Alireza R |e verfasserin |4 aut | |
700 | 1 | |a Patel, Dinesh K |e verfasserin |4 aut | |
700 | 1 | |a Jin, Hanbyul |e verfasserin |4 aut | |
700 | 1 | |a Marzano, Martina |e verfasserin |4 aut | |
700 | 1 | |a Berilla, Michael |e verfasserin |4 aut | |
700 | 1 | |a Newell, David B |e verfasserin |4 aut | |
700 | 1 | |a Elmquist, Randolph E |e verfasserin |4 aut | |
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