Quantitative analysis of thin films of RBa2Cu3O7−x (R-rare earth elements) and ZrO2 (Y2O3) buffer layers by SNMS
Abstract It is shown that RBa2Cu3O7-X single crystals may be used as reference samples for the quantitative analysis of RBa2Cu3O7-X thin films by SNMS. RSF-values for Y and Cu (relative to Ba) determined for ceramic RBa2Cu3O7-X samples are higher than those for single crystals. This difference may be caused by Ba segregation on grain boundaries. The depth profile analysis of YSZ/Al2O3 samples was performed by DBM using a Ni grid to prevent sample charging. The reproducibility of analysis was better than 10%..
Medienart: |
E-Artikel |
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Erscheinungsjahr: |
1996 |
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Erschienen: |
1996 |
Reproduktion: |
Springer Online Journal Archives 1860-2002 |
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Enthalten in: |
Zur Gesamtaufnahme - volume:356 |
Enthalten in: |
Fresenius' Zeitschrift für analytische Chemie - 356(1996) vom: Aug., Seite 484-487 |
Sprache: |
Englisch |
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Beteiligte Personen: |
Rebane, J. A. [Sonstige Person] |
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Links: |
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Umfang: |
4 |
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Förderinstitution / Projekttitel: |
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PPN (Katalog-ID): |
NLEJ201828588 |
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245 | 1 | 0 | |a Quantitative analysis of thin films of RBa2Cu3O7−x (R-rare earth elements) and ZrO2 (Y2O3) buffer layers by SNMS |
264 | 1 | |c 1996 | |
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520 | |a Abstract It is shown that RBa2Cu3O7-X single crystals may be used as reference samples for the quantitative analysis of RBa2Cu3O7-X thin films by SNMS. RSF-values for Y and Cu (relative to Ba) determined for ceramic RBa2Cu3O7-X samples are higher than those for single crystals. This difference may be caused by Ba segregation on grain boundaries. The depth profile analysis of YSZ/Al2O3 samples was performed by DBM using a Ni grid to prevent sample charging. The reproducibility of analysis was better than 10%. | ||
533 | |f Springer Online Journal Archives 1860-2002 | ||
700 | 1 | |a Rebane, J. A. |4 oth | |
700 | 1 | |a Kaul, A. R. |4 oth | |
700 | 1 | |a Tretyakov, Yu D. |4 oth | |
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856 | 4 | 0 | |u http://dx.doi.org/10.1007/s0021663560484 |
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