Quantitative analysis of thin films of RBa2Cu3O7−x (R-rare earth elements) and ZrO2 (Y2O3) buffer layers by SNMS

Abstract It is shown that RBa2Cu3O7-X single crystals may be used as reference samples for the quantitative analysis of RBa2Cu3O7-X thin films by SNMS. RSF-values for Y and Cu (relative to Ba) determined for ceramic RBa2Cu3O7-X samples are higher than those for single crystals. This difference may be caused by Ba segregation on grain boundaries. The depth profile analysis of YSZ/Al2O3 samples was performed by DBM using a Ni grid to prevent sample charging. The reproducibility of analysis was better than 10%..

Medienart:

E-Artikel

Erscheinungsjahr:

1996

Erschienen:

1996

Reproduktion:

Springer Online Journal Archives 1860-2002

Enthalten in:

Zur Gesamtaufnahme - volume:356

Enthalten in:

Fresenius' Zeitschrift für analytische Chemie - 356(1996) vom: Aug., Seite 484-487

Sprache:

Englisch

Beteiligte Personen:

Rebane, J. A. [Sonstige Person]
Kaul, A. R. [Sonstige Person]
Tretyakov, Yu D. [Sonstige Person]

Links:

dx.doi.org

Umfang:

4

Förderinstitution / Projekttitel:

PPN (Katalog-ID):

NLEJ201828588